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Electrical Sciences and …
Theses and Dissertations
Electrical Sciences and Computer Engineering Theses and Dissertations
Theses and Dissertations for the Electrical Sciences and Computer Engineering department.
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Soft error
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Type
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Doctoral Dissertation
Year
1
2012
Language
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English
Keyword
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Device reliability
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Failure rate
1
Modeling
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Nanowires
1
Shot noise
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Device reliability
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Failure rate
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Modeling
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Nanowires
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Shot noise
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Simulation
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Soft error
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Tunneling devices
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Low-Voltage End-of-Roadmap Transistors and their Reliability in the Presence of Noise
Description:
Silicon technology has so far obeyed the downscaling trend predicted by Moore’s Law. However, as device dimensions and power supply downscale, transistors and node capacitors …
Year:
2012
Contributor:
Jannaty, Pooya (creator)
Zaslavsky, Alexander (Director)
Mundy, Joseph (Reader)
Bahar, R. (Reader)
Brown University. ENGINEERING: Electrical Science and Computer Engineering (sponsor)
Genre:
theses
Subject:
Device reliability
Shot noise
Thermal noise
Failure rate
Soft error
Single event
Tunneling devices
Simulation
Modeling
Nanowires
Simulation methods
Collection:
Engineering
Electrical Sciences and Computer Engineering
Theses and Dissertations
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