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Description:: Whiskers are electrically conducting filaments that form spontaneously in Sn systems and are a reliability risk in electronics. Despite being extensively studied, a fundamental understanding …
Year:: 2022
Contributor:: Jain, Nupur (creator); Chason, Eric (Advisor); Kim, Kyung-Suk (Reader); Kumar, Sharvan (Reader); Qi, Yue (Reader); Brown University. School of Engineering (sponsor)
Genre:: theses
Subject:: Thin film stress; Sn whiskers; Pressure induced whiskers; Nucleation and growth kinetics
Collection:: Engineering; Theses and Dissertations

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